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题  目:光学干涉检测方法及其挑战
报告人:沈华 教授
时  间:2024-04-19 14:00
地  点:研发大厦西侧报告厅
题  目:量子点超晶格中激子传输的复合电动力学机制
报告人:香港科技大学 苑荣峰 助理教授
时  间:2024-04-12 10:00
地  点:学术交流中心报告厅
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Metrology systems for large freeform mirrors
  2017-09-22 Dr. ir. Gerard, Business Unit Manager
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  专 家 介 绍Gerard graduated at the University of Twente in Applied Physics and obtained his PhD from the TUDelft in 1999. He started his own consultancy company in 2004 which in 2008 grew out into the Focal Vision & Optics design and engineering firm. As of 2016, when Focal was acquired by DEMCON, Gerard is Business Unit Manager Focal optomechatronic systems. 

  内 容 简 介 

  In many industries, space industry in particular, there is a need for off-axis and freeform precision mirrors of large size. Freeform polishing systems are available but rely on suitable metrology for absolute precision. In this presentation a non-contact measurement method is explained, as used in the Nanomefos system for measuring large optics. Additionally a measurement system is introduced for measuring very large optics, the Megamefos. 

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